Method of preparing a semiconductor having a controlled crystal

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

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438150, 438487, H01L 21324

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active

058829601

ABSTRACT:
A semiconductor device is disclosed. The semiconductor device has a crystalline silicon film as an active layer region. The crystalline silicon film has needle-like or columnar crystals oriented parallel to the substrate and having a crystal growth direction of (111) axis. A method for preparing the semiconductor device comprises steps of adding a catalytic element to an amorphous silicon film; and heating the amorphous silicon film containing the catalytic element at a low temperature to crystallize the silicon film.

REFERENCES:
patent: 5147826 (1992-09-01), Liu et al.
patent: 5275851 (1994-01-01), Fonash et al.
patent: 5278093 (1994-01-01), Yonehara
Caune et al., Combined CW Laser and Furnace Annealing of Amorphous Si and Ge in Contact With Some Metals, Applied Surface Science, vol. 36, 1989, pp. 597-604.
Bonnel et al., Polycrystalline Silicon Thin-Film Transistors with Two-Step Annealing Process, IEEE Electron Device Letters, vol. 14, No. 12. Dec. 1993, pp. 551-553.
Batstone et al., "In situ TEM studies of the crystallization of amorphous silicon: the role of silicides", Microscopy of Semiconducting Materials 1993, pp. 165-172.
Hayzelden et al., Silicide formation and silicide-mediated crystallization of nickel-implanted amorphous silicon thin films, J. Appl. Phys., vol. 73, No. 12, 15 Jun. 1993.
Schoenfeld et al., "Crystallization of amorphous silicon by NiSi2 precipitates", Thin Solid Films 261, 1995, pp. 236-240.
C. Hayzelden et al., "In Situ Transmission Electron Microscopy Studies of Silicide-Mediated Crystallization of Amorphous Silicon" (3 pages).
A.V. Dvurechenski et al., "Transport Phenomena in Amorphous Silicon Doped by Ion Implanatation of 3d Metals", Akademikian Lavrentev Prospekt 13, 630090 Novosibirsk 90, USSR, pp. 635-640.
T. Hempel et al., "Needile-Like Crystallization of Ni Doped Amorphous Silicon Thin Films", Solid State Communications, vol. 85, No. 11, pp. 921-924, 1993.
English Translation of Japanese Patent Office Communication about Claim Rejection of Corresponding Japanese Patent Application.

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