Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-07-01
2008-07-01
Hirshfeld, Andrew H (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S076110, C324S522000
Reexamination Certificate
active
07394279
ABSTRACT:
In a method of measuring a surface voltage of an insulating layer, the number of times that surface voltages are measured in a depletion region increases so that precise data about the depletion region may be obtained. The number of times that the surface voltages are measured in an accumulation region and an inversion region decreases so that the data about the depletion region may be rapidly obtained.
REFERENCES:
patent: 4812756 (1989-03-01), Curtis et al.
patent: 5485091 (1996-01-01), Verkuil et al.
patent: 7075318 (2006-07-01), Zhang et al.
patent: 2003-092319 (2003-03-01), None
patent: 2004-111911 (2004-04-01), None
English language abstract of Japanese Publication No. 2003-092319 Pub. Date: Mar. 28, 2003.
English language abstract of Japanese Publication No. 2004-111911 Pub. Date: Apr. 8, 2004.
Jun Chung-Sam
Lee Byung-Sug
Lee Mi-Sung
Yang Yu-Sin
He Amy
Hirshfeld Andrew H
Marger & Johnson & McCollom, P.C.
Samsung Electronics Co,. Ltd.
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