Method of manufacturing transistor having germanium implant...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S305000, C438S520000, C438S528000

Reexamination Certificate

active

07118979

ABSTRACT:
The present invention provides a transistor100having a germanium implant region170located therein, a method of manufacture therefor, and an integrated circuit including the aforementioned transistor. The transistor100, in one embodiment, includes a polysilicon gate electrode140located over a semiconductor substrate110, wherein a sidewall of the polysilicon gate electrode140has a germanium implanted region170located therein. The transistor100further includes source/drain regions160located within the semiconductor substrate110proximate the polysilicon gate electrode140.

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patent: 6682980 (2004-01-01), Chidambaram et al.
patent: 6699771 (2004-03-01), Robertson
K.K. Ng et al. Suppression of Hot-Carrier Degradation in Si MOSFET's by Germanium Doping. IEEE 1990, pp. 45-47.
K. H. Kwok et al. Boron Diffusion in High-Dose Germanium-Implanted Silicon. IEEE 1998, pp. 878-881.

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