Method of manufacturing semiconductor device having resistor fil

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438382, H01L 2702

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active

060837853

ABSTRACT:
An isolation is formed in a part of a P-well of a semiconductor substrate. A resistor film as a first conductor member is formed on the isolation. An insulating film covering the resistor film except for contact formation regions and an upper electrode film as a second conductor member are formed simultaneously with the formation of a gate electrode and a gate oxide film. Silicide films of a refractory metal are formed on the respective surfaces of the gate electrode, N-type high-concentration diffusion layers, the contact formation regions of the resistor film, and the upper electrode film. By utilizing a salicide process, a resistor and an inductor each occupying a small area can be formed without lowering the resistance of the resistor film. A capacitor, the resistor, and like component are selectively allowed to function.

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Patent Abstracts of Japan, vol. 016, No. 271 (E-1218), Jun. 18, 1992 & JP 04 054217 A (ROHM Co., Ltd.) Feb. 28, 1992 (Abstract).

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