Method of manufacturing semiconductor device having bipolar tran

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438234, H01L 218238

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active

060279621

ABSTRACT:
A method of manufacturing a semiconductor device can suppress an etching damage to a bipolar transistor part and a CMOS transistor part while simplifying a manufacturing process. According to this manufacturing method, an external base leader electrode layer which will form an external base leader electrode is used as an etching protection film for forming a CMOS transistor, and a layered film including a polycrystalline silicon film which will ultimately form a gate electrode is used as an etching protection film during formation of a bipolar transistor. Thereby, a step of forming the etching protection film can be utilized also as a step of forming the external base electrode and the gate electrode. Consequently, the etching damages to the bipolar transistor part and the CMOS transistor part are suppressed while simplifying the manufacturing process.

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patent: 5444003 (1995-08-01), Wang et al.
patent: 5471083 (1995-11-01), Ikeda et al.
patent: 5525530 (1996-06-01), Watabe

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