Method of manufacturing semiconductor apparatus

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C257S330000, C257SE21429

Reexamination Certificate

active

07947556

ABSTRACT:
A method of manufacturing a semiconductor apparatus includes forming a trench in a semiconductor layer, forming a gate electrode inside the trench, forming a thermally-oxidized film on the gate electrode inside the trench, forming a silicate glass film on the thermally-oxidized film inside the trench, forming a body region inside the semiconductor layer, and forming a source region on the body region. The method provides a semiconductor apparatus having reduced fluctuation of a channel length and low ON-resistance.

REFERENCES:
patent: 4767722 (1988-08-01), Blanchard
patent: 6472678 (2002-10-01), Hshieh et al.
patent: 2002/0009854 (2002-01-01), Hshieh et al.
patent: 2005/0139873 (2005-06-01), Kobayashi
patent: 2008/0274599 (2008-11-01), Kobayashi
patent: 1436371 (2003-08-01), None
patent: 1638148 (2005-07-01), None
patent: 2000-252468 (2000-09-01), None
patent: 2003-101027 (2003-04-01), None
patent: 2005-191359 (2005-07-01), None
patent: WO 01/99177 (2001-12-01), None
patent: WO 03/046999 (2003-06-01), None
Chinese Office Action date Jan. 8, 2010, with English translation.

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