Etching a substrate: processes – Etching of semiconductor material to produce an article...
Reexamination Certificate
2011-07-19
2011-07-19
Consilvio, Mark (Department: 2872)
Etching a substrate: processes
Etching of semiconductor material to produce an article...
C216S079000, C216S099000, C438S029000, C438S770000, C438S791000
Reexamination Certificate
active
07981303
ABSTRACT:
A novel silicon micromirror structure for improving image fidelity in laser pattern generators is presented. In some embodiments, the micromirror is formed from monocrystalline silicon. Analytical- and finite element analysis of the structure as well as an outline of a fabrication scheme to realize the structure are given. The spring constant of the micromirror structure can be designed independently of the stiffness of the mirror-surface. This makes it possible to design a mirror with very good planarity, resistance to sagging during actuation, and it reduces influence from stress in reflectivity-increasing multilayer coatings.
REFERENCES:
patent: 4845048 (1989-07-01), Tamaki et al.
patent: 4999312 (1991-03-01), Yoon
patent: 6051866 (2000-04-01), Shaw et al.
patent: 6093330 (2000-07-01), Chong et al.
patent: 6355181 (2002-03-01), McQuarrie
patent: 6551944 (2003-04-01), Fallica et al.
patent: 6827869 (2004-12-01), Podlesnik et al.
patent: 6833079 (2004-12-01), Giordani
patent: 7537994 (2009-05-01), Taylor et al.
patent: 7582532 (2009-09-01), Han et al.
patent: 2001/0044165 (2001-11-01), Lee et al.
patent: 2006/114127 (2006-11-01), None
International Search Report for Application PCT/EP208/062641, mailed May 14, 2009.
Bring, M. et al., “Novel Monocrystalline Silicoin Micromirrors for Maskless Lithography”, Solid-State Sensors, Actuators and Microsystems Conference, 2009, Transducrers, 2007, International IEEE, Piscataway, NJ, US, Jun. 10, 2007, pp. 1083-1086.
Arney S.C. et al., “Formation of Submicron Silicon-on-Insulator Structures by Lateral Oxidation of Substrate-Silicon Islands”, Journal of Vacuum Science & Technology, Part B, AVS/AIP, vol. 6 No. 1, Jan. 1, 1988, pp. 341-345.
International Prelimnary Report on Patentability for Application PCT/EP208/062641, mailed Oct. 5, 2010.
Bring Martin
Enoksson Peter
Beffel, Jr. Ernest J.
Consilvio Mark
Haynes Beffel & Wolfeld LLP
Micronic Mydata AB
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