Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-07-23
2010-06-22
Lee, Calvin (Department: 2892)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257S318000
Reexamination Certificate
active
07741179
ABSTRACT:
A method of manufacturing a flash semiconductor device minimizes a loss of dopant caused by dopant out-diffusion. A trench is formed in a semiconductor substrate. At least one poly gate is formed in the semiconductor substrate including the trench. An RCS (Recess Common Source) region is formed in the trench. Dopant ions are implanted into the RCS region, and an annealing process is applied to the RCS region.
REFERENCES:
patent: 6583046 (2003-06-01), Okada et al.
patent: 7445998 (2008-11-01), Young et al.
patent: 2005/0145920 (2005-07-01), Chang et al.
patent: 2007/0010056 (2007-01-01), Kim
Dongbu Hi-Tek Co., Ltd.
Lee Calvin
Sherr & Vaughn, PLLC
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