Method of manufacturing electronic device and method of...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S724000

Reexamination Certificate

active

10885713

ABSTRACT:
The invention provides a semiconductor device, which removes troubles occurring when the parasitic capacitance between layered wiring lines with an interlayer insulating film therebetween is reduced, and have a simple structure and high reliability. The electronic device according to the invention can include a semiconductor layer formed on a substrate, a gate insulating layer formed on the semiconductor layer, a gate electrode having a predetermined pattern and formed on the gate insulating layer, an interlayer insulating film formed to cover the gate electrode, a source electrode and a drain electrode formed on the interlayer insulating film. The interlayer insulating film can be mainly made of silicon oxynitride with a nitrogen concentration of atomic percent or higher.

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