Method of manufacturing a transistor

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S231000, C438S232000, C438S300000, C438S305000, C438S306000

Reexamination Certificate

active

10898484

ABSTRACT:
A method of manufacturing a transistor according to some embodiments includes sequentially forming a dummy gate oxide layer and a dummy gate electrode on an active region of a semiconductor substrate, ion-implanting a first conductive impurity into source/drain regions to form first impurity regions, and ion-implanting the first conductive impurity to form second impurity regions that are overlapped by the first impurity regions. The method includes forming a pad polysilicon layer on the source/drain regions, sequentially removing the pad polysilicon layer and the dummy gate electrode from a gate region of the semiconductor substrate, annealing the semiconductor substrate, and ion-implanting a second conductive impurity to form a third impurity region in the gate region. The method includes removing the dummy gate oxide layer, forming a gate insulation layer, and forming a gate electrode on the gate region.

REFERENCES:
patent: 6265272 (2001-07-01), Chen
patent: 6319807 (2001-11-01), Yeh et al.
patent: 6348385 (2002-02-01), Cha et al.
patent: 6514827 (2003-02-01), Kim et al.
patent: 6677212 (2004-01-01), Yoshioka et al.
patent: 6875680 (2005-04-01), Park
patent: 6998318 (2006-02-01), Park
patent: 7018873 (2006-03-01), Dennard et al.
patent: 7026203 (2006-04-01), Lee
patent: 7064038 (2006-06-01), Kudo et al.
patent: 2002/0037619 (2002-03-01), Sugihara et al.
patent: 2002/0117698 (2002-08-01), Inumiya et al.
patent: 2003/0219953 (2003-11-01), Mayuzumi

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing a transistor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing a transistor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing a transistor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3776139

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.