Method of manufacturing a semiconductor memory device...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S289000, C438S291000, C438S303000

Reexamination Certificate

active

11171710

ABSTRACT:
A semiconductor device comprises a plurality of gate structures formed on a substrate, a gate spacer formed on a sidewall of the gate structures, a semiconductor pattern formed on the substrate between the gate structures, a first impurity region and a second impurity region formed in the semiconductor pattern and at surface portions of the substrate, respectively, wherein the first and second impurity regions include a first conductive type impurity, and a channel doping region surrounding the first impurity region, wherein the channel doping region includes a second conductive type impurity.

REFERENCES:
patent: 6229177 (2001-05-01), Yeap et al.
patent: 6277695 (2001-08-01), Williams et al.
patent: 6287905 (2001-09-01), Kim et al.
patent: 6350656 (2002-02-01), Lin et al.
patent: 6369425 (2002-04-01), Ferla et al.
patent: 6747312 (2004-06-01), Boden, Jr.
patent: 2003/0020115 (2003-01-01), Spring et al.
patent: 2003/0205829 (2003-11-01), Boden, Jr.
patent: 2005/0067662 (2005-03-01), Lee et al.
patent: 2000-0061227 (2000-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing a semiconductor memory device... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing a semiconductor memory device..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing a semiconductor memory device... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3776243

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.