Method of manufacturing a semiconductor device having a gate...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S199000, C438S933000

Reexamination Certificate

active

07148096

ABSTRACT:
An aspect of the present invention includes a first conductive type semiconductor region formed in a semiconductor substrate, a gate electrode formed on the first conductive type semiconductor region, a channel region formed immediately below the gate electrode in the first conductive type semiconductor region, and a second conductive type first diffusion layers constituting source/drain regions formed at opposite sides of the channel region in the first conductive type semiconductor region, the gate electrode being formed of polycrystalline silicon-germanium, in which the germanium concentration of at least one of the source side and the drain side is higher than that of the central portion.

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patent: 5965926 (1999-10-01), Schwalke
patent: 6312995 (2001-11-01), Yu
patent: 6528399 (2003-03-01), Alieu et al.
patent: 6545317 (2003-04-01), Hokazono et al.
patent: 6746943 (2004-06-01), Takayanagi et al.
T-J. King, et al. IEEE Transactions on Election Devices, vol. 41, No. 2 pp. 228-232, “Electrical Properties of Heavily Doped Polycrystalline Silicon-Germanium Films”. Feb. 1994.

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