Method of manufacturing a semiconductor device having a...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Multiple layers

Reexamination Certificate

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C438S435000, C438S792000, C257S632000, C257SE21576, C257SE21493, C257SE29015

Reexamination Certificate

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07550397

ABSTRACT:
Embodiments relate to a semiconductor device and a method of manufacturing a semiconductor device having a pre-metal dielectric liner. In embodiments, method for forming a semiconductor device may include forming a pre-metal dielectric liner, which has a multi-layer structure including a plurality of interfacial surfaces, on an entire surface of a semiconductor substrate formed with a transistor, and forming a boron phospho silicate glass (BPSG) oxide layer on the pre-metal dielectric liner. Since the pre-metal dielectric liner is formed in a multi-layer structure having a plurality of interfacial surfaces, boron (B) of an upper BPSG oxide layer is not penetrated into the semiconductor substrate.

REFERENCES:
patent: 6287951 (2001-09-01), Lucas et al.
patent: 7091088 (2006-08-01), Cheng et al.

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