Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-06-21
2005-06-21
Zarabian, Amir (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S300000, C438S301000, C438S305000, C438S514000
Reexamination Certificate
active
06908823
ABSTRACT:
The present invention relates to a method of manufacturing a semiconductor device. According to the present invention, a passivation layer is temporarily formed on semiconductor substrate and a process of implanting impurities is conducted by the passivation layer as a protection mask, thereby inducing damages of substrate due to ion implantation processes to be minimized.According to the present invention, implantation of impurities depends on thickness of the passivation layer, so that it is made possible to freely control impurity implantation by controlling thickness of passivation layer. Therefore, it is made possible to control a diffusion range of the lightly doped source/drain electrode.
REFERENCES:
patent: 5079180 (1992-01-01), Rodder et al.
patent: 5319232 (1994-06-01), Pfiester
patent: 6025242 (2000-02-01), Ma et al.
patent: 6156613 (2000-12-01), Wu
patent: 6232641 (2001-05-01), Miyano et al.
patent: 6350656 (2002-02-01), Lin et al.
patent: 6521502 (2003-02-01), Yu
patent: 0 984 487 (2000-03-01), None
DongbuAnam Semiconductor Inc.
Duong Khanh
Pillsbury Winthrop Shaw & Pittman LLP
Zarabian Amir
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