Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2008-10-24
2010-11-09
Garber, Charles D (Department: 2812)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C438S104000, C438S288000, C438S593000, C257SE21180, C257SE21333, C257SE21680, C977S721000, C977S773000
Reexamination Certificate
active
07829445
ABSTRACT:
Provided may be a method of fabricating a flash memory device having metal nano particles. The method of manufacturing a flash memory device may include forming a metal oxide thin layer on a semiconductor substrate, forming a floating gate of an amorphous metal silicon oxide thin layer by performing a thermal treatment process on the semiconductor substrate where the metal oxide thin layer is formed, and forming metal nano particles in the floating gate by projecting an electron beam on the floating gate, the metal nano particles being surrounded by a silicon oxide layer.
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Jung Jae-Hun
Kim Tae-Whan
Lee Jeong-Yong
Shin Jae-Won
Garber Charles D
Harness Dickey & Pierce
Lee Cheung
Samsung Electronics Co,. Ltd.
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