Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2005-01-18
2005-01-18
Chen, Jack (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S266000
Reexamination Certificate
active
06844231
ABSTRACT:
A method of manufacturing a flash memory cell. The method includes controlling a wall sacrificial oxidization process, a wall oxidization process and a cleaning process of a trench insulating film that are performed before/after a process of forming the trench insulating film for burying a trench to etch the trench insulating film to a desired space. Therefore, it is possible to secure the coupling ratio of a floating gate by maximum and implement a device of a smaller size.
REFERENCES:
patent: 6057580 (2000-05-01), Watanabe et al.
patent: 6222225 (2001-04-01), Nakamura et al.
patent: 6376877 (2002-04-01), Yu et al.
patent: 6391722 (2002-05-01), Koh
patent: 6417047 (2002-07-01), Isobe
patent: 6448606 (2002-09-01), Yu et al.
patent: 6620681 (2003-09-01), Kim et al.
patent: 20020068398 (2002-06-01), Dong et al.
patent: 20030119256 (2003-06-01), Dong et al.
patent: 20030119259 (2003-06-01), Jeong et al.
patent: 20030119263 (2003-06-01), Lee et al.
patent: 20030137003 (2003-07-01), Taylor
Ahn Jung Ryul
Jung Sung Mun
Kim Jum Soo
Lee Young Bok
Shin Young Ki
Chen Jack
Hynix Semiconductor
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