Method of manufacturing a capacitor

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

H01L 218242

Patent

active

060308664

ABSTRACT:
A capacitor and a method of manufacturing a capacitor which includes the steps of sequentially forming an insulating layer and an etch stop layer over a semiconductor substrate; selectively etching the etch stop layer and the insulating layer to form a contact hole; forming a plug within the contact hole; forming a pillar on the etch stop layer adjacent to the plug and on the plug; forming a dielectric layer at the sides of the pillar; removing the pillar and forming a conductive layer over the dielectric layer; and forming an insulating layer over the conductive layer and etching the insulating layer and the conductive layer to expose the upper portion of the dielectric layer.

REFERENCES:
patent: 5160762 (1992-11-01), Brand et al.
patent: 5447881 (1995-09-01), Ryou
patent: 5496757 (1996-03-01), Rosner
patent: 5691227 (1997-11-01), Kim
patent: 5700709 (1997-12-01), Park et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of manufacturing a capacitor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of manufacturing a capacitor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing a capacitor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-682392

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.