Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1995-02-09
1997-05-27
Niebling, John
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438594, 438981, H01C 218247, H01C 21265
Patent
active
056331843
ABSTRACT:
A semiconductor memory device effectively prevents formation of a gate bird's beak oxide film at a region through which electrons move in data writing and erasing operations. In the semiconductor memory device, nitride films having a thickness larger than that of a first gate oxide film are formed on a drain impurity diffusion layer and a source impurity diffusion layer to surround the first gate oxide film. A floating gate electrode has opposite ends protruded over the nitride films.
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Imai Yukari
Otani Naoko
Tamura Katsuhiko
Booth Richard A.
Mitsubishi Denki & Kabushiki Kaisha
Niebling John
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