Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-03-11
2008-03-11
Trinh, Michael (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S151000, C438S157000, C438S284000, C257SE21421
Reexamination Certificate
active
11142057
ABSTRACT:
Methods are provided for forming a semiconductor device from a substrate comprising a bottom gate layer, a channel layer overlying the bottom gate layer, and a top gate structure formed over the channel layer. First, a hardmask comprising a first material interposed between a second material and a third material is deposited over a portion of the top gate structure. Then, the hardmask and top gate structure are encapsulated with an insulating material to form a spacer. A channel structure is formed from the channel layer, and the channel structure is disposed under the spacer. A bottom gate structure is formed from the bottom gate layer, and the bottom gate structure is disposed under the channel structure. Then, a source/drain contact is formed around the bottom gate structure.
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Disclosure for Freescale U.S. Appl. No. 10/971,657 filed on Oct. 22, 2004.
Banerjee Suman K.
Dao Thuy B.
Hartin Olin L.
John Jay P.
Li Philip
Freescale Semiconductor Inc.
Ingrassia Fisher & Lorenz P.C.
Trinh Michael
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