Method of making and accessing split gate memory device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438304, 438563, 438596, 438933, H01L 21336

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active

058245847

ABSTRACT:
A non-volatile memory having a control gate (14) and a sidewall select gate (28) is illustrated. The sidewall select gate (28) is formed in conjunction with a semiconductor doped oxide (20) to form a non-volatile memory cell (7). The semiconductor element used to dope the oxide layer (20) will generally include silicon or germanium. The non-volatile memory cell (7) is programmed by storing electrons in the doped oxide (20), and is erased using band-to-band tunneling.

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