Method of making a trench MOSFET with deposited oxide

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S270000, C257S330000

Reexamination Certificate

active

07371641

ABSTRACT:
A trench type power semiconductor device which includes deposited rather than grown oxide in the trenches for the electrical isolation of electrodes disposed inside the trenches from the semiconductor body.

REFERENCES:
patent: 6051468 (2000-04-01), Hshieh
patent: 6291298 (2001-09-01), Williams et al.
patent: 6809375 (2004-10-01), Takemori et al.
patent: 2003/0085422 (2003-05-01), Amali et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of making a trench MOSFET with deposited oxide does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of making a trench MOSFET with deposited oxide, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making a trench MOSFET with deposited oxide will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3983498

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.