Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-06-19
2007-06-19
Huynh, Andy (Department: 2818)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S201000, C438S211000, C438S266000, C438S593000
Reexamination Certificate
active
11040516
ABSTRACT:
The present invention relates to a method of making a multibit non-volatile memory and especially to a method of making a flash memory such as a fast-programmable Flash EEPROM (Electrically Erasable Programmable Read-Only Memory) device relying on hot-electron injection for programming which is particularly suited for high density low-voltage low-power applications and employs only two polysilicon layers.
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Haspeslagh Luc
Houdt Jan Van
Huynh Andy
Infineon AG
Interuniversitair Microelektronica Centrum vzw
Knobbe Martens Olson & Bear LLP
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