Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Patent
1997-10-31
1999-08-10
Quach, T. N.
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
Insulated gate formation
438596, 438657, 438683, 438755, H01L 21302, H01L 21336
Patent
active
059373199
ABSTRACT:
A method of fabricating a polysilicon gate 8 in a metal oxide semiconductor (MOS) transistor in an integrated circuit includes providing a metal layer 18, such as cobalt, on the sidewall 12 of the polysilicon gate 8, silicidizing the metal with the polysilicon in the polysilicon gate 8 to form a metal silicide sidewall 20, and removing the metal silicide sidewall 20 by etching.
REFERENCES:
patent: 4716131 (1987-12-01), Okazawa et al.
patent: 4839309 (1989-06-01), Easter et al.
patent: 5227320 (1993-07-01), Johnson et al.
patent: 5231042 (1993-07-01), Ilderem et al.
patent: 5670794 (1997-09-01), Manning
patent: 5753546 (1998-05-01), Koh et al.
patent: 5814537 (1998-09-01), Maa et al.
Gupta Subash
Lin Ming-Ren
Xiang Qi
Advanced Micro Devices , Inc.
Quach T. N.
LandOfFree
Method of making a metal oxide semiconductor (MOS) transistor po does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of making a metal oxide semiconductor (MOS) transistor po, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of making a metal oxide semiconductor (MOS) transistor po will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1130302