Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2007-01-05
2010-02-09
Smoot, Stephen W (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S435000, C257SE21628
Reexamination Certificate
active
07659170
ABSTRACT:
By recessing the isolation structure of a transistor prior to silicidation, the series resistance may be reduced due to the increased amount of metal silicide formed in the vicinity of the isolation structure. By recessing the isolation structure prior to the formation of the gate electrode, an increased degree of poly wrap around may be obtained, thereby increasing the effective channel width.
REFERENCES:
patent: 6159823 (2000-12-01), Song et al.
patent: 6232640 (2001-05-01), Okada et al.
patent: 6245637 (2001-06-01), Tsai
patent: 2005/0127468 (2005-06-01), Ito
patent: 2006/0001108 (2006-01-01), Yamamoto
patent: 2006/0121688 (2006-06-01), Ko et al.
Forseberg Markus
Gerhardt Martin
Horstmann Manfred
Schwan Christoph
GlobalFoundries Inc.
Smoot Stephen W
Williams Morgan & Amerson P.C.
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