Method of incorporating nitrogen into metal silicate based...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S761000, C438S763000, C438S765000

Reexamination Certificate

active

06864141

ABSTRACT:
A method of making a thin gate dielectric includes providing a metal silicate on a silicon substrate. Nitrogen is implanted into the metal silicate.

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