Method of in situ cleaning a vacuum plasma processing chamber

Details Method of in situ cleaning a vacuum plasma processing chamber Method of in situ cleaning a vacuum plasma processing chamber

1996-01-02

1997-10-21

Breneman, R. Bruce

Adhesive bonding and miscellaneous chemical manufacture

Delaminating processes adapted for specified product

Delaminating in preparation for post processing recycling step

1566431, 134 11, 134 221, B44C 122

Patent

active

056792158

ABSTRACT:
Surfaces having semiconductor oxides, metal oxides and hydrocarbons deposited thereon in a vacuum plasma processing chamber are in situ cleaned by introducing water vapor and SF.sub.6 and/or NF.sub.3 gas in the presence of a plasma discharge. The vapor and gas react to form gaseous HF, and an acidic gas including at least one of H.sub.2 SO.sub.4 and HNO.sub.3. The discharge ionizes and dissociates the HF and acidic gases to form gaseous reactants for the deposits. The reactants chemically react with the deposits, including the oxides and hydrocarbons, to vaporize these deposits. The vaporized deposits are pumped out of the chamber by the same pump which normally evacuates the chamber to a vacuum. Oxygen and/or H.sub.2 O.sub.2 vapors are introduced in the presence of the plasma to additionally clean the surfaces.

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