Method of high speed data rate testing

Details Method of high speed data rate testing Method of high speed data rate testing

2005-09-13

2005-09-13

Whitehead, Jr., Carl (Department: 2813)

Semiconductor device manufacturing: process

With measuring or testing

Electrical characteristic sensed

C438S018000, C438S015000, C438S014000

Reexamination Certificate

active

06943044

ABSTRACT:
A method to optimize a data strobe for a multiple circuit, automatic test system is achieved. The method comprises, first, probing, in parallel, a circuit group wherein the circuit group comprises a plurality of circuits. Next, a data strobe of an automatic test system is initialized to a strobe set point relative to a system clock cycle. Next, the function of each of the circuits is partially tested, in parallel, using the strobe set point. Next, the circuit yield of the circuit group from the step of partially testing at the strobe set point is logged. Next, the data strobe is updated to a new strobe set point. Next, the steps of testing, logging, and updating are repeated until a specified range of strobe set points is completed. Finally, the data strobe is set for the circuit group to the strobe set point associated with the highest circuit yield.

REFERENCES:
patent: 4412327 (1983-10-01), Fox et al.
patent: 6240042 (2001-05-01), Li

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