Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate
Patent
1998-11-17
2000-11-07
Monin, Jr., Donald L.
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
By reaction with substrate
438275, 438766, 438783, 257616, H01L 2131
Patent
active
061436690
ABSTRACT:
A method for manufacturing a gate oxide film in a semiconductor device includes: preparing a semiconductor substrate having a first and a second active region; implanting germanium ions into the first active region; and forming a first and a second gate oxide films on the first and the second active regions, respectively, wherein the first gate oxide film is thicker than the second gate oxide film.
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Doyle, B.; Soleimani, H.R.; Philipossian, A., Simultaneous Growth of Dlfferent Thickness Gate Oxides in Silicon CMOS Processing. IEEE Electron Device Letters, vol. 16, No. 7 Jul. 1995, pp. 301-302.
Hyundai Electronics Industries Co,. Ltd.
Monin, Jr. Donald L.
Peralta Ginette
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