Cleaning and liquid contact with solids – Processes – Including application of electrical radiant or wave energy...
Reexamination Certificate
2007-06-19
2007-06-19
Deo, Duy-Vu N. (Department: 1765)
Cleaning and liquid contact with solids
Processes
Including application of electrical radiant or wave energy...
C134S001100, C134S001200, C134S001300
Reexamination Certificate
active
11007884
ABSTRACT:
There is provided a method of forming a thin film for providing improved fabrication productivity. The method includes introducing a semiconductor substrate into a process chamber. A process thin film is formed on the semiconductor substrate, in which a chamber coating layer is formed on inner walls of the process chamber while the process thin film is formed. The semiconductor substrate is removed from the process chamber. A stress relief layer is formed on the chamber coating layer. After all of the above operations are repeatedly performed at least one time, an in-situ cleaning is performed on the chamber coating layer and the stress relief layer, which are alternately formed in stack on the inner walls of the process chamber.
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Kim Weon-Hong
Kwon Dae-Jin
Won Seok-Jun
Deo Duy-Vu N.
Mills & Onello LLP
Samsung Electronics Co,. Ltd.
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