Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Forming nonplanar surface
Patent
1987-12-07
1990-08-07
Dees, Jose G.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Forming nonplanar surface
430326, 430327, 430330, 4273741, G03C 516
Patent
active
049467646
ABSTRACT:
A method for forming a resist pattern comprises the steps of coating a resist on a substrate, baking the resist, selectively radiating electromagnetic waves or particle rays onto a surface of the resists, and developing the resist. The method further comprises, after the baking step and before the developing step, the step of cooling the resist in such a manner that a temperature control plate is disposed parallel to and adjacent to the substrate.
REFERENCES:
patent: 4717645 (1988-01-01), Kato et al.
Matsuoka Yasuo
Tsuchiya Takashi
LandOfFree
Method of forming resist pattern and resist processing apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming resist pattern and resist processing apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming resist pattern and resist processing apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-960301