Method of forming contacts and vias in semiconductor

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438629, 438625, 438648, 438688, 438637, H01L 21283

Patent

active

059982969

ABSTRACT:
A method of filling openings (20, 50) in a semiconductor (10, 40) includes the steps of first forming a fill metal layer (30, 60) over the semiconductor which substantially covers the openings (20, 50). Thereafter, a surface coating (32, 62, 64) of a predetermined material is formed over the fill metal layer (30, 60). Then, high pressure is applied on the surface coating (32, 62, 64) to force the fill metal into the openings (20, 50). Metal film surface cracks previously plaguing force-fill processes are thereby eliminated or substantially reduced.

REFERENCES:
patent: 5073518 (1991-12-01), Doan et al.
patent: 5266521 (1993-11-01), Lee et al.
patent: 5312775 (1994-05-01), Fujii et al.
patent: 5412250 (1995-05-01), Brugge
patent: 5432732 (1995-07-01), Ohmi
patent: 5471084 (1995-11-01), Suzuki et al.
patent: 5488014 (1996-01-01), Harada et al.
patent: 5534463 (1996-07-01), Lee et al.
patent: 5580823 (1996-12-01), Hegde et al.
patent: 5610103 (1997-03-01), Xu et al.
patent: 5613296 (1997-03-01), Kurino et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming contacts and vias in semiconductor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming contacts and vias in semiconductor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming contacts and vias in semiconductor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-823247

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.