Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-04-11
2006-04-11
Smoot, Stephen W. (Department: 2813)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S600000
Reexamination Certificate
active
07026217
ABSTRACT:
A method of producing an antifuse includes introducing nitrogen by ion implantation means into the substrate. An oxide dielectric layer is then formed on the nitrided substrate in a wet oxidation ambient. The conditions of the ion implantation and the oxidation are controlled to generate a dielectric with uniform thickness and a low breakdown voltage when subjected to a high electric field.
REFERENCES:
patent: 4757359 (1988-07-01), Chiao et al.
patent: 5330920 (1994-07-01), Soleimani et al.
patent: 5610084 (1997-03-01), Solo de Zaldivar
patent: 5763922 (1998-06-01), Chau
patent: 2004/0004269 (2004-01-01), Fifield et al.
patent: 2004/0051162 (2004-03-01), Chidambarrao et al.
Gopinath Venkatesh P.
Kamath Arvind
Pachura David
Yeh Wen-Chin
Beyer Weaver & Thomas
LSI Logic Corporation
Smoot Stephen W.
LandOfFree
Method of forming an antifuse on a semiconductor substrate... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of forming an antifuse on a semiconductor substrate..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming an antifuse on a semiconductor substrate... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3545436