Method of forming an antifuse on a semiconductor substrate...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S600000

Reexamination Certificate

active

07026217

ABSTRACT:
A method of producing an antifuse includes introducing nitrogen by ion implantation means into the substrate. An oxide dielectric layer is then formed on the nitrided substrate in a wet oxidation ambient. The conditions of the ion implantation and the oxidation are controlled to generate a dielectric with uniform thickness and a low breakdown voltage when subjected to a high electric field.

REFERENCES:
patent: 4757359 (1988-07-01), Chiao et al.
patent: 5330920 (1994-07-01), Soleimani et al.
patent: 5610084 (1997-03-01), Solo de Zaldivar
patent: 5763922 (1998-06-01), Chau
patent: 2004/0004269 (2004-01-01), Fifield et al.
patent: 2004/0051162 (2004-03-01), Chidambarrao et al.

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