Method of forming a semiconductor thin film

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor

Reexamination Certificate

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C438S489000

Reexamination Certificate

active

07396744

ABSTRACT:
A method of fabricating a semiconductor thin film is provided, comprising: forming an insulation layer on a semiconductor substrate; etching the insulation layer to form a plurality of openings exposing the substrate at the bottom of the openings; filling the openings with a semiconductor seed layer; forming an amorphous layer on the seed layer and the insulation layer; transforming the amorphous layer to a polycrystalline layer by exposing the amorphous layer to a first laser irradiation at a first energy level; and forming a single semiconductor crystalline film by annealing the polycrystalline layer and the semiconductor seed layer with a second laser irradiation at a second energy level.

REFERENCES:
patent: 4489478 (1984-12-01), Sakurai
patent: 5970369 (1999-10-01), Hara et al.
patent: 6096626 (2000-08-01), Smith et al.
patent: 6746942 (2004-06-01), Sato et al.
patent: 6815717 (2004-11-01), Horikoshi et al.
patent: 6867074 (2005-03-01), Tsao
patent: 6884699 (2005-04-01), Ogawa et al.
patent: 7326876 (2008-02-01), Jung
patent: 2005/0277235 (2005-12-01), Son et al.

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