Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2009-07-16
2011-10-11
Trinh, Michael (Department: 2822)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S626000, C438S635000, C257SE21583
Reexamination Certificate
active
08034705
ABSTRACT:
A plug comprises a first insulating interlayer, a tungsten pattern and a tungsten oxide pattern. The first insulating interlayer has a contact hole formed therethrough on a substrate. The tungsten pattern is formed in the contact hole. The tungsten pattern has a top surface lower than an upper face of the first insulating interlayer. The tungsten oxide pattern is formed in the contact hole and on the tungsten pattern. The tungsten oxide pattern has a level face.
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Choi Suk-Hun
Hong Chang-Ki
Jung Ju-Young
Son Yoon-Ho
Onello & Mello LLP
Samsung Electronics Co,. Ltd.
Trinh Michael
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