Method of forming a seam-free tungsten plug

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S626000, C438S635000, C257SE21583

Reexamination Certificate

active

08034705

ABSTRACT:
A plug comprises a first insulating interlayer, a tungsten pattern and a tungsten oxide pattern. The first insulating interlayer has a contact hole formed therethrough on a substrate. The tungsten pattern is formed in the contact hole. The tungsten pattern has a top surface lower than an upper face of the first insulating interlayer. The tungsten oxide pattern is formed in the contact hole and on the tungsten pattern. The tungsten oxide pattern has a level face.

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patent: 5244534 (1993-09-01), Yu et al.
patent: 6638861 (2003-10-01), Ngo et al.
patent: 6872656 (2005-03-01), Sakai
patent: 2006/0141771 (2006-06-01), Jang
patent: 2008/0247214 (2008-10-01), Ufert
patent: 2008/0304312 (2008-12-01), Ho et al.
patent: 5-299397 (1993-11-01), None
patent: 1998-029400 (1998-07-01), None
patent: 10-0234398 (1999-09-01), None

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