Method of forming a non-volatile memory cell having a high coupl

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438259, 438300, H01L 21336

Patent

active

061597961

ABSTRACT:
In a non-volatile memory cell having a floating gate (EEPROM), it is necessary to achieve a large coupling capacitance between the floating gate and a control gate in which the gates take up as little space as possible. To that end, it is provided that a dielectric between the floating gate and the control gate runs, in portions, approximately perpendicularly to the surface of a semiconductor substrate, for example, with the control gate configured within a U-shaped or pot-shaped floating gate.

REFERENCES:
patent: 4979004 (1990-12-01), Esquivel et al.
patent: 5281548 (1994-01-01), Prall
patent: 5315142 (1994-05-01), Acovic et al.
patent: 5472893 (1995-12-01), Iida
patent: 5474947 (1995-12-01), Chang et al.
patent: 5543339 (1996-08-01), Roth et al.
patent: 5576567 (1996-11-01), Mori
patent: 5726081 (1998-03-01), Lin et al.
patent: 5965913 (1999-10-01), Yuan et al.
patent: 5981338 (1999-11-01), Lee
Japanese Patent Abstract No. 63229860 (Takao), dated Sep. 26, 1988.
Japanese Patent Abstract No. 03034581 (Akihiro), dated Feb. 14, 1991.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming a non-volatile memory cell having a high coupl does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming a non-volatile memory cell having a high coupl, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a non-volatile memory cell having a high coupl will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-216165

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.