Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-04-15
2008-04-15
Pizarro, Marcos (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S592000, C438S595000, C257SE21404
Reexamination Certificate
active
07358139
ABSTRACT:
The invention includes methods of forming field effect transistors. In one implementation, a method of forming a field effect transistor having a gate comprising a conductive metal or metal compound received over conductively doped semiconductive material includes forming transistor gate semiconductive material into a gate line over a semiconductive material channel region. The gate line includes semiconductive material sidewalls. The semiconductive material sidewalls of the gate line are oxidized. After the oxidizing, at least one of a conductive metal or metal compound is formed in electrical connection with the transistor gate semiconductive material to comprise a substantially coextensive elongated portion of a final construction of the gate line of the field effect transistor being formed.
REFERENCES:
patent: 4755478 (1988-07-01), Abernathey et al.
patent: 4901128 (1990-02-01), Sunami et al.
patent: 5063168 (1991-11-01), Vora
patent: 5278438 (1994-01-01), Kim et al.
patent: 5420060 (1995-05-01), Gill et al.
patent: 5691212 (1997-11-01), Tsai et al.
patent: 6033963 (2000-03-01), Huang et al.
patent: 6117743 (2000-09-01), Yeh et al.
patent: 6156602 (2000-12-01), Shao et al.
patent: 6303494 (2001-10-01), Yeo et al.
patent: 6346438 (2002-02-01), Yagishita et al.
patent: 6830975 (2004-12-01), Bicksler et al.
Microchip Fabrication: A Practical Guide to Semiconductor Processing; Van Zant, Peter; 4thed., 2000, pp. 303-305 and 401-402.
Bicksler Andrew R.
Sandhu Sukesh
Micro)n Technology, Inc.
Pizarro Marcos
Wells St. John P.S.
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