Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Plasma
Patent
1996-10-29
2000-01-11
Mulpuri, Savitri
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Plasma
438514, H01L 21265
Patent
active
060135662
ABSTRACT:
A method for implanting shallow regions in a semiconductor substrate comprises heating the backside of the substrate with a lamp or other heating method, and implanting the frontside of the substrate using plasma doping. In a further embodiment, the frontside of the substrate is also heated, using rapid thermal processing during implantation. Implantation damage is simultaneously annealed during implantation, so that a subsequent anneal, if needed at all, is done using rapid thermal annealing.
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Mattiussi, G.A., et al., "The Effect of Implant and Rapid Thermal Annealing Temperatures on Ion Beam Mixing of Titanium Silicide", Mat. Res. Soc. Symp. Proc., vol. 76, Materials Research Society, pp. 323-329, (1987).
Rhodes Howard E.
Thakur Randhir P. S.
Micro)n Technology, Inc.
Mulpuri Savitri
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