Method of forming a crown shape capacitor

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438254, H01L 218242

Patent

active

058518770

ABSTRACT:
An etching process is used to etch the polysilicon layer. Then, Polymers are formed on the polysilicon layer after an ash step is performed. An organic layer is formed on the surface of the polysilicon layer, and on the polymers. An anisotropically etch is carried out to etch the organic layer, thereby forming organic side wall spacers on the side walls of the polysilicon layer. The etching is continuously performed to etch the polysilicon layer using the polymers and organic side wall spacers as masks. Next, an ash and a RCA clean procedure are performed to remove the residual polymers and the organic layer. A dielectric layer is then deposited on the surface of the polysilicon. A conductive layer is deposited over the dielectric layer.

REFERENCES:
patent: 5399518 (1995-03-01), Sim et al.
patent: 5444005 (1995-08-01), Kim et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of forming a crown shape capacitor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of forming a crown shape capacitor, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of forming a crown shape capacitor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2046917

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.