Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-08-12
2010-11-09
Fahmy, Wael M (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S555000, C438S556000, C257S398000, C257S519000, C257S648000, C257SE29016
Reexamination Certificate
active
07829420
ABSTRACT:
A semiconductor device has a channel termination region for using a trench30filled with field oxide32and a channel stopper ring18which extends from the first major surface8through p-well6along the outer edge36of the trench30,under the trench and extends passed the inner edge34of the trench. This asymmetric channel stopper ring provides an effective termination to the channel10which can extend as far as the trench30.
REFERENCES:
patent: 4523369 (1985-06-01), Nagakubo
patent: 4729006 (1988-03-01), Daly et al.
patent: 5130268 (1992-07-01), Liou et al.
patent: 5206535 (1993-04-01), Namose
patent: 5801082 (1998-09-01), Tseng
patent: 5904541 (1999-05-01), Rho et al.
patent: 6096612 (2000-08-01), Houston
patent: 6144086 (2000-11-01), Brown et al.
patent: 6355540 (2002-03-01), Wu
patent: 2002/0053699 (2002-05-01), Kim et al.
Fahmy Wael M
Kalam Abul
NXP B.V.
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