Method of fabricating vertical channel semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE21629

Reexamination Certificate

active

07910437

ABSTRACT:
A method for fabricating a semiconductor device may include: forming an outer trench, including: a first trench, and a second trench formed under the first trench, the second trench being formed by etching a substrate, forming a dielectric layer, which fills the second trench, by performing a thermal oxidation process, such that a width of the second trench is less than a width of the first trench, forming a gate dielectric layer along a surface of a semiconductor structure including the dielectric layer, and forming a gate electrode, which fills a remaining portion of the outer trench, over the gate dielectric layer.

REFERENCES:
patent: 6198127 (2001-03-01), Kocon
patent: 6433385 (2002-08-01), Kocon et al.
patent: 6673681 (2004-01-01), Kocon et al.
patent: 7368352 (2008-05-01), Kim et al.
patent: 7560344 (2009-07-01), Kim et al.
patent: 7679146 (2010-03-01), Tu et al.
patent: 2009/0242971 (2009-10-01), Cho et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of fabricating vertical channel semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of fabricating vertical channel semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating vertical channel semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2652791

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.