Method of fabricating silicided LDD transistor

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438305, 438392, 438396, H01L 21265

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active

056588151

ABSTRACT:
A gate-drain overlapped device, comprising: a first conductive type substrate; a gate insulating film formed on the substrate; a gate comprising a gate conductive line patterned on the gate insulating film, and a conductive layer coated on the gate conductive line and extending to a predetermined length on the gate insulating film; and a drain/source region comprising a second conductive type low density diffusion region in the substrate below the extending area of the conductive layer and a second conductive type high density diffusion region in contact with the low density diffusion region in the substrate, which is significantly improved in the resistance of a polysilicon gate conductive line and in uniform electrical properties.

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patent: 5543340 (1996-08-01), Lee

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