Method of fabricating semiconductor device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C438S195000, C438S283000, C438S306000, C257SE21045, C257SE21159, C257SE21179

Reexamination Certificate

active

07632734

ABSTRACT:
A method of fabricating a semiconductor device is disclosed. The method of fabricating a semiconductor device provides a semiconductor substrate. A gate dielectric layer is formed on the semiconductor substrate. A first conductive layer is formed on the gate dielectric layer, wherein the first conductive layer is an in-situ doped conductive layer. A second conductive layer is formed on the first conductive layer. The second conductive layer and the first conductive layer are patterned to form a gate electrode.

REFERENCES:
patent: 5736440 (1998-04-01), Manning
patent: 5926706 (1999-07-01), Liaw et al.
patent: 5930615 (1999-07-01), Manning
patent: 6127212 (2000-10-01), Chen et al.
patent: 6291325 (2001-09-01), Hsu
patent: 6967384 (2005-11-01), Beintner et al.
patent: 2003/0102503 (2003-06-01), Rabkin et al.

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