Method of fabricating load resistor

Semiconductor device manufacturing: process – Making passive device – Resistor

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438385, 438527, 438530, 438330, H01L 2120

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active

061401986

ABSTRACT:
A method of fabricating a load resistor. The load resistor is often applied in a static random access memory. The interconnect between different conductive regions such as gate and source/drain region is formed by applying a hydrogen treatment to a refractory metal oxide layer, while the load resistors are formed by applying a hydrogen treatment with different parameters as the former one. The insulation is formed by the refractory metal oxide layer which is not to be covered.

REFERENCES:
patent: 4663825 (1987-05-01), Maeda
patent: 4965214 (1990-10-01), Choi et al.
patent: 5013677 (1991-05-01), Hozumi
patent: 5218217 (1993-06-01), Oda et al.
patent: 5622884 (1997-04-01), Liu
patent: 5885862 (1999-03-01), Jao et al.
patent: 6015728 (2000-01-01), Chou
patent: 6017790 (2000-01-01), Liou et al.
Keu Hong Kim, Eung Ju Oh, Jae Shi Choi; Electrical Conductivity of "Hydrogen-Reduced" Titanium Dioxide (Rutile); 1994.
D.S.Ginley, R.P. Hellmer; Polysilicon Resistor Modification with Hydrogen Plasmas on Fabricated Integrated Circuits; Journal of the Electrochemical Society, Aug. 1987.

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