Method of fabricating high threshold metal oxide silicon read-on

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438305, H01L 218246

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active

056311800

ABSTRACT:
A method of forming ROM transistor memory cell including not forming lightly doped regions in the semiconductor substrate for some of the memory cells so as to form one type of memory cell and forming the lightly doped regions in another type of memory cell.

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