Method of fabricating electrostatic discharge protection device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

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438281, 438592, H01L 21265

Patent

active

059602880

ABSTRACT:
A method of fabricating an electrostatic protection device, comprises a semiconductor substrate which includes a first type well, a second type well, and a field oxide layer in between. A first gate, a first spacer, and a first source/drain are formed in the first type well. The second type has a second gate, a second spacer, and the second source/drain formed therein. In addition, an oxide layer is distributed on the first gate, the second gate, a part of the first source/drain, and a part of the second source/drain. A silicide layer is formed on the uncovered first source/drain and the uncovered second source/drain. Therefore, the silicide layer and the gate oxide layer are spaced apart.

REFERENCES:
patent: 5246872 (1993-09-01), Mortensen
patent: 5262344 (1993-11-01), Mistry
patent: 5374565 (1994-12-01), Hsue et al.
patent: 5416036 (1995-05-01), Hsue
patent: 5516717 (1996-05-01), Hsu
patent: 5529941 (1996-06-01), Huang
patent: 5585299 (1996-12-01), Hsu
patent: 5672527 (1997-09-01), Lee
patent: 5733794 (1998-03-01), Gilbert et al.

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