Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1998-06-17
2000-08-01
Niebling, John F.
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438239, 438240, 438250, 438253, 438393, 438394, 438395, 438396, 438660, 438686, H01L 218234
Patent
active
060965932
ABSTRACT:
A method of fabricating a capacitor of a semiconductor device is disclosed including the step of forming a lower electrode layer on a semiconductor substrate, and a dielectric on the lower electrode layer, a part of the lower electrode layer, a part of the upper electrode layer adjacent to the dielectric of the capacitor including the upper electrode on the dielectric, or all of them containing oxygen.
REFERENCES:
patent: 4963701 (1990-10-01), Yasumoto et al.
patent: 5443030 (1995-08-01), Ishihara et al.
patent: 5555486 (1996-09-01), Kingon et al.
patent: 5599424 (1997-02-01), Matsumoto et al.
patent: 5714402 (1998-02-01), Choi
patent: 5736422 (1998-04-01), Lee et al.
patent: 5790366 (1998-08-01), Desu et al.
patent: 5869901 (1999-02-01), Kusuyama
patent: 5932907 (1999-08-01), Grill et al.
Joo Jae Hyun
Seon Jeong Min
Gurley Lynne A.
LG Semicon Co. Ltd.
Niebling John F.
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