Method of fabricating a trench capacitor DRAM device

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S386000, C257SE21396

Reexamination Certificate

active

11160853

ABSTRACT:
The present invention discloses a STI-first process for making trench DRAM devices. According to the preferred embodiment, the etching recipe for etching the STI region in the memory array is completely compatible with the logic STI process.

REFERENCES:
patent: 5111259 (1992-05-01), Teng et al.
patent: 5466628 (1995-11-01), Lee et al.
patent: 5470778 (1995-11-01), Nagata et al.
patent: 5858857 (1999-01-01), Ho
patent: 5913118 (1999-06-01), Wu
patent: 2006/0124982 (2006-06-01), Ho et al.
patent: 8-70108 (1996-03-01), None

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