Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-04-26
2011-04-26
Arora, Ajay K (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE27112, C438S149000, C438S479000, C438S517000
Reexamination Certificate
active
07932560
ABSTRACT:
A method of forming a substrate contact in a semiconductor device, comprising the steps of providing a semiconductor base substrate (2) having a buried oxide (BOX) layer (4) and a thin active semiconductor layer (103) on the BOX layer (4), forming a trench (104) in the active semiconductor layer (103) and the Box layer (4) to the semiconductor base substrate (2) below, and then depositing another active semiconductor (epitoxial) layer (6) over the remaining active semiconductor layer (103) and in the trench (104) to create the substrate contact. The trench (104) is etched at a location on the wafer corresponding to a scribe lane (106).
REFERENCES:
patent: 5194395 (1993-03-01), Wada
patent: 2002/0115244 (2002-08-01), Park et al.
patent: 2005/0176184 (2005-08-01), Okihara
patent: 2005/0236712 (2005-10-01), Tsao et al.
patent: 1193760 (2002-04-01), None
patent: 6151576 (2008-07-01), None
Arora Ajay K
NXP B.V.
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