Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-12-30
2009-12-08
Smith, Bradley K (Department: 2894)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S176000, C438S197000, C438S259000, C438S585000, C257S365000, C257SE21197, C257SE21429
Reexamination Certificate
active
07629219
ABSTRACT:
A dual polysilicon gate of a semiconductor device includes a substrate having a first region, a second region, and a third region, a channel region with a recessed structure formed in the first region of the substrate, a gate insulating layer formed over the substrate, a first polysilicon layer filled into the channel region, and formed over the gate insulating layer of the first and second regions, a second polysilicon layer formed over the gate insulating layer of the third region, and an insulating layer doped with an impurity, and disposed inside the first polysilicon layer in the channel region.
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Cho Heung-Jae
Lim Kwan-Yong
Sung Min-Gyu
Hynix / Semiconductor Inc.
Nguyen Duy T
Smith Bradley K
Townsend and Townsend / and Crew LLP
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