Method of efficiently loading scan and non-scan memory elements

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S724000

Reexamination Certificate

active

07447960

ABSTRACT:
The present invention provides a method and apparatus for efficiently loading values into scan and non-scan memory elements. First, the network used to distribute control signals to the memory elements is cleared. Second, the desired values are loaded into the scan memory elements. Third, the values from the scan memory elements are propagated to the non-scan memory elements.

REFERENCES:
patent: 5329471 (1994-07-01), Swoboda et al.
patent: 6510534 (2003-01-01), Nadeau-Dostie et al.
patent: 2003/0115522 (2003-06-01), Nadeau-Dostie et al.
patent: 2003/0177428 (2003-09-01), Wakabayashi et al.
patent: 2003/0188278 (2003-10-01), Carrie

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of efficiently loading scan and non-scan memory elements does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of efficiently loading scan and non-scan memory elements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of efficiently loading scan and non-scan memory elements will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4026082

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.